发明名称 Orthogonal ion sampling for APCI mass spectrometry
摘要 A method and apparatus are disclosed wherein a plurality of electric fields and of orthogonal spray configurations of vaporized analyte are so combined as to enhance the efficiency of analyte detection and mass analysis. The invention provides reduced noise and increased signal sensitivity in both APT electrospray and APCI operating modes.
申请公布号 US6498343(B2) 申请公布日期 2002.12.24
申请号 US20010910222 申请日期 2001.07.19
申请人 AGILENT TECHNOLOGIES, INC. 发明人 APFFEL JAMES A.;WERLICH MARK H.;BERTSCH JAMES L.;GOODLEY PAUL C.
分类号 G01N30/72;H01J49/04;(IPC1-7):H01J49/26 主分类号 G01N30/72
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