| 摘要 |
A pattern generator that generates a test pattern used for testing an electric part including: a pattern memory that stores test pattern information, which defines the test pattern; a vector memory that stores a vector instruction, which indicates an order for reading out the test pattern information from the pattern memory; an address expansion unit that generates an address of the test pattern information in the pattern memory according to the vector instruction stored in the vector memory; an interruption pattern memory that stores interruption test pattern information, which defines the test pattern during a predetermined interruption process; an interruption vector memory, which is different from the vector memory, that stores an interruption vector instruction which indicates an order for reading out the interruption test pattern information from the interruption pattern memory;an interruption address expansion unit that generates an address of the interruption test pattern information according to the interruption vector instruction stored in the interruption vector memory; and a pattern generating unit that generates the test pattern based on the test pattern information corresponding to the address generated by the address expansion unit or the interruption test pattern information corresponding to the address generated by the interruption address expansion unit.
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