发明名称 |
Process for producing semiconductor device |
摘要 |
A process for producing a semiconductor device including plural element forming regions having different element region widths W and element isolating regions between said element forming regions. The process includes forming trenches on a semiconductor substrate having previously accumulated thereon a first dielectric film for forming isolating regions;accumulating a second dielectric film having a thickness t on the semiconductor substrate to fill in trenches;removing part of the second dielectric film on element forming regions that have an element regions width W satisfying the following equation:wherein theta represents a accumulation angle of said second dielectric film on said element forming region; andpolishing the second dielectric film.
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申请公布号 |
US6498072(B2) |
申请公布日期 |
2002.12.24 |
申请号 |
US20010900453 |
申请日期 |
2001.07.09 |
申请人 |
SHARP KABUSHIKI KAISHA |
发明人 |
AZUMA KENICHI |
分类号 |
H01L21/76;H01L21/762;H01L21/8234;H01L27/06;(IPC1-7):H01L21/76 |
主分类号 |
H01L21/76 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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