发明名称 Illumination system for shaping extreme ultraviolet radiation used in a lithographic projection apparatus
摘要 In a lithographic projection apparatus, extreme ultraviolet radiation, e.g., of a wavelength of 13 nm, is generated by an undulator 10 in an electron storage ring. The radiation is collected by a first relay mirror 13, and an image of the source waist is formed at an intermediate plane. At the intermediate plane, a first scattering mirror 14 is provided to increase the divergence of the radiation beam in at least one plane. A second relay mirror 15 images the first scattering mirror onto the entrance pupil 18 of the projection system of the lithographic apparatus. A second scattering mirror 16 folds the projection beam onto the mask 17 and further increases the divergence of the radiation beam.
申请公布号 US6498351(B1) 申请公布日期 2002.12.24
申请号 US20000521599 申请日期 2000.03.09
申请人 ASML NETHERLANDS B.V. 发明人 KRUIZINGA BORGERT;ESCUDERO SANZ ISABEL
分类号 G02B5/02;G02B5/08;G02B19/00;G03F7/20;H01L21/027;(IPC1-7):A61N5/00;G21G5/00;G21R5/10 主分类号 G02B5/02
代理机构 代理人
主权项
地址