发明名称 Semiconductor device and manufacturing method thereof
摘要 A MISFET is provided with a segmented channel comprising regions in which the channel is inverted by a first gate voltage and regions in which the channel is inverted by a second gate voltage. The MISFET is formed in a semiconductor substrate having a first conductivity type and the first inversion region of the channel has a first impurity concentration determined by the surface concentration of the substrate. The second inversion region of the channel has a second impurity concentration determined by doping an impurity to the region selected by a photolithographic process. The first and second inversion regions may be divided into a plurality of plane shapes and the threshold voltage of the MISFET is set to a desired value in accordance with the plane area ratio of the first and second inversion regions.
申请公布号 US6498376(B1) 申请公布日期 2002.12.24
申请号 US19950459831 申请日期 1995.06.02
申请人 SEIKO INSTRUMENTS INC 发明人 MIYAGI MASANORI;KONISHI HARUO;KUBO KAZUAKI;KOJIMA YOSHIKAZU;SHIMIZU TORU;SAITOH YUTAKA;MACHIDA TORU;KANEKO TETSUYA
分类号 H01L21/322;H01L21/336;H01L21/8234;H01L27/07;H01L29/10;H01L29/786;(IPC1-7):H01L29/76;H01L29/94;H01L31/062;H01L31/113 主分类号 H01L21/322
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