发明名称 METHOD OF PROCESSING COMPOUND SEMICONDUCTOR MATERIAL, AND SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a processing method for compensating or suppressing the defects left or created within an implantation layer by adding a process of irradiation of accelerated particles including elements belonging to a lower group of the periodic table out of the constituent elements of compound semiconductor material, when performing the valence electron control of the above compound semiconductor material by irradiation of particles including impurity atoms and anneal treatment for activation. SOLUTION: This method includes a process of irradiation of accelerated particles including impurity elements for valence electron control to a compound semiconductor material composed of group II and group VI elements a group III and group V elements, or the mixture of these crystals, a process of irradiation of accelerated particles including the elements belonging to a lower group out of the constituent elements of the above compound semiconductor material, and a process of heat-treating the above compound semiconductor material irradiated with particles.
申请公布号 JP2002367922(A) 申请公布日期 2002.12.20
申请号 JP20010167975 申请日期 2001.06.04
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 DEGUCHI MASAHIRO;YOKOGAWA TOSHIYA
分类号 H01L21/265;(IPC1-7):H01L21/265 主分类号 H01L21/265
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