发明名称 METHOD FOR PROCESSING III-V SEMICONDUCTOR WAFER AND PROCESSED WAFER
摘要 PROBLEM TO BE SOLVED: To provide a III-V semiconductor wafer becoming a substrate on which high performance semiconductor laser chips having uniform performance can be fabricated with a high yield. SOLUTION: In the method for processing a III-V semiconductor wafer, a wafer is sliced from a III-V semiconductor ingot (S1), orientation flat(OF) of the wafer is formed by cleavage (S2), dirsts and oxide films are removed from the OF surface by alkaline cleaning (SA1), and then a strain layer introduced at the time of slicing the wafer is removed by etching (S3).
申请公布号 JP2002367940(A) 申请公布日期 2002.12.20
申请号 JP20010172410 申请日期 2001.06.07
申请人 SUMITOMO ELECTRIC IND LTD 发明人 KORENAGA JUNSUKE
分类号 H01L21/308;H01L21/304;(IPC1-7):H01L21/304 主分类号 H01L21/308
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