QUALITY DECIDING METHOD FOR SEMICONDUCTOR LASER ELEMENT AND QUALITY DECIDING DEVICE USED THEREFOR

摘要

PROBLEM TO BE SOLVED: To provide a quality deciding method for a semiconductor laser element which can speedily inspect the stability of single-mode oscillation of the semiconductor laser element with high precision and a quality deciding device used for the method. SOLUTION: Central wavelengths of laser beams oscillated from the semiconductor element are respectively measured to draw a curve relational with the central wavelength and an injected current, when the injected current is varied. The relational curve is differentiated with respect to the injected current, and the absence/presence of a discontinuous point 7 is observed in the obtained differentiated curve. Preferably, the central wavelength is measured by means of a wavelength meter in the disclosed quality deciding method for the semiconductor element.