发明名称 METHOD AND DEVICE FOR TESTING OR CALIBRATING A PRESSURE SENSOR ON A WAFER
摘要 <p>A method is provided for testing or calibrating a pressure sensor of a number of pressure sensors placed in a wafer (10), whereby the pressure sensor has a pressure-sensitive section and a signal output. The method comprises a step involving the pressure-tight joining of the pressure-sensitive section of the pressure sensor to a fluid line (60), a step involving the application of a predetermined pressure onto the pressure-sensitive section of the pressure sensor via the fluid line (60), and a step involving the reception of a signal from the signal output of the pressure sensor.</p>
申请公布号 WO2002101348(A1) 申请公布日期 2002.12.19
申请号 EP2002006350 申请日期 2002.06.10
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