发明名称 Nonvolatile semiconductor memory device and programming method thereof
摘要 A nonvolatile semiconductor memory device of the present invention has a well voltage detecting circuit. The well voltage detecting circuit detects whether a pocket p-type well voltage is equal to or is lower than a detection voltage (e.g., 0.1V) and outputs a detection signal at a high or low level. When the pocket p-type well voltage is identical to or lower than the detection voltage, a word line select signal generating circuit generates row select signals of respective rows in response to the detection signal. With this device, in case a well voltage of the pocket p-type well is increased due to applying a voltage into an unselected bit line, program and pass voltages are supplied to word lines at a point of time when the increased well voltage becomes lower than the detection voltage of the well voltage detecting circuit.
申请公布号 US2002191443(A1) 申请公布日期 2002.12.19
申请号 US20020131424 申请日期 2002.04.22
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE YEONG-TAEK;LIM YOUNG-HO
分类号 G11C16/02;G11C16/04;G11C16/06;G11C16/12;H01L21/8247;H01L27/10;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):G11C11/34 主分类号 G11C16/02
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