发明名称 |
Method and apparatus for measuring a signal spectrum |
摘要 |
A spectrum analyser used for making a spectrum emission mask measurement reorganises execution of the measurement so that all frequency bands to be measured at the same resolution bandwidth are measured in a single sweep, extending between the extreme frequency limits of those bands, thereby avoiding setup delays involved in specifying successive measurements for each band individually. Portions of each measurement which correspond to frequency bands to be measured at the respective resolution bandwidth of that measurement are extracted, resized as necessary, and assembled into a complete spectrum measurement.
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申请公布号 |
US2002191686(A1) |
申请公布日期 |
2002.12.19 |
申请号 |
US20020139466 |
申请日期 |
2002.05.07 |
申请人 |
AGILENT TECHNOLOGIES, INC. |
发明人 |
SNADDON STUART;SCHULLER ROY |
分类号 |
G01R23/173;G01R23/16;H04B17/00;(IPC1-7):H04B17/00 |
主分类号 |
G01R23/173 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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