Method and system for including parametric in-line test data in simulations for improved model to hardware correlation

摘要

A method of performing model to hardware correlation that simulates models based upon design criteria and manufactures devices based upon the design criteria. The method evaluates features of the devices during the manufacturing to produce in-line test parametric data, compares the models to the in-line test parametric data to obtain correlation data, and modifies the simulating according to the correlation data.