发明名称 Semiconductor circuit device and process for manufacturing the same
摘要 A process for manufacturing a semiconductor circuit device includes the steps of forming a plurality of semiconductor chips (2) across dicing lines (3) on a wafer (1), dividing each chip from the wafer, die-bonding the chip onto a die-pad (11) of the lead-frame, connecting a pad electrode (12) of the chip and a terminal (14) of the lead-frame with a wire (15), and forming a resin seal (16) covering the connection between the pad electrode and the terminal. Then, the dicing line has a predetermined width for dividing each chip, and the dicing line includes a test element group (4) and an adjusting mark (5). Accordingly, in the step of forming the plurality of chips, a cross line (6) having no test element group and no adjusting mark is provided on the dicing line for connecting between the pad electrode and the terminal with the wire.
申请公布号 US2002190357(A1) 申请公布日期 2002.12.19
申请号 US20020143984 申请日期 2002.05.14
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 KOSUGI RYUICHI;KAWAMURA HIDEKI
分类号 H01L21/60;H01L23/544;(IPC1-7):H01L21/44;H01L21/48;H01L21/50;H01L21/30;H01L21/46;H01L23/495;H01L23/48;H01L29/40 主分类号 H01L21/60
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