发明名称 |
System and process for analyzing surface defects |
摘要 |
Three-dimensional analysis of surface defects and microdefects of an object is performed by correlating two images of the surface of the object based upon a stereoscopic view thereof. Analyzing surface defects may be implemented by integrating, in a single monolithic component made using VLSI CMOS technology, an optical sensor with a cellular neural network. The optical sensor includes a matrix of cells configured as analog processors.
|
申请公布号 |
US2002191831(A1) |
申请公布日期 |
2002.12.19 |
申请号 |
US20020132876 |
申请日期 |
2002.04.25 |
申请人 |
STMICROELECTRONICS S.R.L. |
发明人 |
SPOTO GIUSEPPE;BRANCIFORTE MARCO;DODDO FRANCESCO;OCCHIPINTI LUIGI |
分类号 |
G01N21/88;G06T7/00;H04N13/00;(IPC1-7):G06K9/00 |
主分类号 |
G01N21/88 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|