发明名称 |
CIRCUIT PATTERN INSPECTION DEVICE,CIRCUIT PATTERN INSPECTION METHOD,AND RECORDING MEDIUM |
摘要 |
A circuit inspection device capable of reliably and easily detecting defects of a circuit board. An inspection signal is supplied to one of conductive patterns (20) from a power supply unit (30) capacitance−coupled with conductive patterns (20) disposed in rows. This inspection signal is detected by an open sensor (40) capacitance−coupled with all the other ends of the conductive patterns (20) in rows, and a pattern disconnection is determined to be cut off when the output is considerably reduced. The inspection signal is also detected by a short sensor (50) offset to the power supply unit (30) capacitance−coupled with the patterns of two rows of the conductive patterns (20) in rows, and if the detected signal is considerably increased or decreased, a pattern is determined to be short−circuited and acceptance or rejection of the patterns is inspected.
|
申请公布号 |
WO02101399(A1) |
申请公布日期 |
2002.12.19 |
申请号 |
WO2002JP05601 |
申请日期 |
2002.06.06 |
申请人 |
OHT INC.;YAMAOKA, SHUJI;ISHIOKA, SHOGO |
发明人 |
YAMAOKA, SHUJI;ISHIOKA, SHOGO |
分类号 |
G01R31/02;G01R31/304;G01R31/312;H05K3/00;(IPC1-7):G01R31/02;G01R31/00 |
主分类号 |
G01R31/02 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|