发明名称 CIRCUIT PATTERN INSPECTION DEVICE,CIRCUIT PATTERN INSPECTION METHOD,AND RECORDING MEDIUM
摘要 A circuit inspection device capable of reliably and easily detecting defects of a circuit board. An inspection signal is supplied to one of conductive patterns (20) from a power supply unit (30) capacitance−coupled with conductive patterns (20) disposed in rows. This inspection signal is detected by an open sensor (40) capacitance−coupled with all the other ends of the conductive patterns (20) in rows, and a pattern disconnection is determined to be cut off when the output is considerably reduced. The inspection signal is also detected by a short sensor (50) offset to the power supply unit (30) capacitance−coupled with the patterns of two rows of the conductive patterns (20) in rows, and if the detected signal is considerably increased or decreased, a pattern is determined to be short−circuited and acceptance or rejection of the patterns is inspected.
申请公布号 WO02101399(A1) 申请公布日期 2002.12.19
申请号 WO2002JP05601 申请日期 2002.06.06
申请人 OHT INC.;YAMAOKA, SHUJI;ISHIOKA, SHOGO 发明人 YAMAOKA, SHUJI;ISHIOKA, SHOGO
分类号 G01R31/02;G01R31/304;G01R31/312;H05K3/00;(IPC1-7):G01R31/02;G01R31/00 主分类号 G01R31/02
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