发明名称 Method of fabricating thin film transistor
摘要 A method of fabricating a thin film transistor includes the steps of (a) forming an amorphous silicon film containing hydrogen therein, on a substrate composed of resin, and (b) irradiating laser beams to the amorphous silicon film at an intensity equal to or smaller than a threshold intensity at which the amorphous silicon film is crystallized. For instance, the step (a) includes the steps of forming the amorphous silicon film on the resin substrate by sputtering, and doping hydrogen ions into the amorphous silicon film.
申请公布号 US2002192882(A1) 申请公布日期 2002.12.19
申请号 US20020119164 申请日期 2002.04.09
申请人 NEC CORPORATION 发明人 OKUMURA HIROSHI
分类号 G02F1/1368;G02F1/136;H01L21/20;H01L21/203;H01L21/28;H01L21/285;H01L21/336;H01L21/77;H01L21/84;H01L27/12;H01L29/786;(IPC1-7):H01L21/00 主分类号 G02F1/1368
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