发明名称 |
SUBSTRATE ASSEMBLY, METHOD OF INSPECTING SUBSTRATE ASSEMBLY, ELECTRO-OPTIC DEVICE, METHOD OF MANUFACTURING ELECTRO-OPTIC DEVICE AND ELECTRONIC APPLIANCE |
摘要 |
PURPOSE: A substrate assembly is provided to perform an electric inspection by using a TFT(Thin Film Transistor) array substrate of a liquid crystal display without detaching a mounted external IC(Integrated Circuit). CONSTITUTION: A substrate assembly includes a substrate(10), a peripheral circuit embedded in the substrate, a first wiring(201) arranged on the substrate, and an external IC, mounted on the substrate, and having a first terminal connected to an interconnection portion arranged on the first wiring. The substrate assembly further includes a second wiring(202) which extends from the interconnection portion in such a manner that the second wiring is routed in a portion of the substrate facing the integrated circuit, and a first external circuit(102) connection terminal arranged on the second wiring in a portion of the substrate not facing the integrated circuit.
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申请公布号 |
KR20020094905(A) |
申请公布日期 |
2002.12.18 |
申请号 |
KR20020032733 |
申请日期 |
2002.06.12 |
申请人 |
SEIKO EPSON CORPORATION |
发明人 |
EGUCHI TSUKASA;FUJIKAWA SHINSUKE;OZAWA TOKURO |
分类号 |
G01R31/28;G02F1/13;G02F1/1345;G02F1/1368;(IPC1-7):G02F1/134 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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