发明名称 SUBSTRATE ASSEMBLY, METHOD OF INSPECTING SUBSTRATE ASSEMBLY, ELECTRO-OPTIC DEVICE, METHOD OF MANUFACTURING ELECTRO-OPTIC DEVICE AND ELECTRONIC APPLIANCE
摘要 PURPOSE: A substrate assembly is provided to perform an electric inspection by using a TFT(Thin Film Transistor) array substrate of a liquid crystal display without detaching a mounted external IC(Integrated Circuit). CONSTITUTION: A substrate assembly includes a substrate(10), a peripheral circuit embedded in the substrate, a first wiring(201) arranged on the substrate, and an external IC, mounted on the substrate, and having a first terminal connected to an interconnection portion arranged on the first wiring. The substrate assembly further includes a second wiring(202) which extends from the interconnection portion in such a manner that the second wiring is routed in a portion of the substrate facing the integrated circuit, and a first external circuit(102) connection terminal arranged on the second wiring in a portion of the substrate not facing the integrated circuit.
申请公布号 KR20020094905(A) 申请公布日期 2002.12.18
申请号 KR20020032733 申请日期 2002.06.12
申请人 SEIKO EPSON CORPORATION 发明人 EGUCHI TSUKASA;FUJIKAWA SHINSUKE;OZAWA TOKURO
分类号 G01R31/28;G02F1/13;G02F1/1345;G02F1/1368;(IPC1-7):G02F1/134 主分类号 G01R31/28
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