发明名称 |
THIN FILM MANUFACTURING APPARATUS, AND MANUFACTURING METHOD THEREOF |
摘要 |
PROBLEM TO BE SOLVED: To provide a thin film manufacturing apparatus for depositing a semiconductor thin film and an insulating thin film capable of reducing the take-in of fluorine atoms into the semiconductor film when manufacturing the thin film using a plasma chemical vapor phase deposition(CVD) method, and a thin film manufacturing method using the apparatus. SOLUTION: In a plasma chemical vapor phase deposition(CVD) apparatus, the surface roughness (Ra) of a member in a vacuum tank is set to be <=5.0μm. The member preferably includes at least an inner wall of the vacuum tank, and a process gas diffusion plate. The residual quantity of fluorine in the vacuum tank is reduced thereby to prevent degradation of TFT performances.
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申请公布号 |
JP2002363754(A) |
申请公布日期 |
2002.12.18 |
申请号 |
JP20010171966 |
申请日期 |
2001.06.07 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
BABA HIROSUKE;TAKEZAWA HIROYOSHI |
分类号 |
C23C16/44;H01L21/205;(IPC1-7):C23C16/44 |
主分类号 |
C23C16/44 |
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