发明名称 THIN FILM MANUFACTURING APPARATUS, AND MANUFACTURING METHOD THEREOF
摘要 PROBLEM TO BE SOLVED: To provide a thin film manufacturing apparatus for depositing a semiconductor thin film and an insulating thin film capable of reducing the take-in of fluorine atoms into the semiconductor film when manufacturing the thin film using a plasma chemical vapor phase deposition(CVD) method, and a thin film manufacturing method using the apparatus. SOLUTION: In a plasma chemical vapor phase deposition(CVD) apparatus, the surface roughness (Ra) of a member in a vacuum tank is set to be <=5.0μm. The member preferably includes at least an inner wall of the vacuum tank, and a process gas diffusion plate. The residual quantity of fluorine in the vacuum tank is reduced thereby to prevent degradation of TFT performances.
申请公布号 JP2002363754(A) 申请公布日期 2002.12.18
申请号 JP20010171966 申请日期 2001.06.07
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 BABA HIROSUKE;TAKEZAWA HIROYOSHI
分类号 C23C16/44;H01L21/205;(IPC1-7):C23C16/44 主分类号 C23C16/44
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