发明名称 |
EXAMINATION SYSTEM FOR PATHOLOGICAL SPECIMEN |
摘要 |
<p>PROBLEM TO BE SOLVED: To provide an examination system capable of enhancing the examination efficiency of pathological examination. SOLUTION: In the examination system for the pathological specimen, a pathological examination trustee performs the pathological examination related to a pathological specimen to successively offer the pathological examination data to a specific person and the specific person performs pathological diagnosis on the basis of the offered pathological examination data and the pathological examination trustee offers the pathological diagnosis result to a pathological specimen donor. In a computerized examination system constituted by computerizing this system, the specific person investigates an examination item to be altered on the basis of the pathological diagnosis result in a process wherein the pathological examination data is successively offered to a specific third person to allow the pathological examination trustee to perform the indication related to the alteration of the examination item.</p> |
申请公布号 |
JP2002365284(A) |
申请公布日期 |
2002.12.18 |
申请号 |
JP20020047119 |
申请日期 |
2002.02.22 |
申请人 |
BML INC |
发明人 |
ICHISAKO REI;YAMAGUCHI TOSHIKAZU |
分类号 |
G01N33/48;G06Q50/22;(IPC1-7):G01N33/48;G06F17/60 |
主分类号 |
G01N33/48 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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