发明名称 EXAMINATION SYSTEM FOR PATHOLOGICAL SPECIMEN
摘要 <p>PROBLEM TO BE SOLVED: To provide an examination system capable of enhancing the examination efficiency of pathological examination. SOLUTION: In the examination system for the pathological specimen, a pathological examination trustee performs the pathological examination related to a pathological specimen to successively offer the pathological examination data to a specific person and the specific person performs pathological diagnosis on the basis of the offered pathological examination data and the pathological examination trustee offers the pathological diagnosis result to a pathological specimen donor. In a computerized examination system constituted by computerizing this system, the specific person investigates an examination item to be altered on the basis of the pathological diagnosis result in a process wherein the pathological examination data is successively offered to a specific third person to allow the pathological examination trustee to perform the indication related to the alteration of the examination item.</p>
申请公布号 JP2002365284(A) 申请公布日期 2002.12.18
申请号 JP20020047119 申请日期 2002.02.22
申请人 BML INC 发明人 ICHISAKO REI;YAMAGUCHI TOSHIKAZU
分类号 G01N33/48;G06Q50/22;(IPC1-7):G01N33/48;G06F17/60 主分类号 G01N33/48
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