发明名称 Sample heating holder, method of observing a sample and charged particle beam apparatus
摘要 High resolution observation of a sample at a high temperature above 1000 C. is accomplished by suppressing sample drift by heating over a short time and with small electric current. A heater envelope made of a ceramic having a carbon coating on the surface is attached around a heater surrounding the sample. The heater envelope is rotatable around pivot screws, and has an outer frame portion of a holder individually having slots capable of letting an FIB enter so that the sample mounting on the holder, as it is, may be milled with the FIB
申请公布号 US6495838(B1) 申请公布日期 2002.12.17
申请号 US19990354633 申请日期 1999.07.16
申请人 HITACHI, LTD.;HITACHI SCIENCE SYSTEMS, LTD. 发明人 YAGUCHI TOSHIE;KAMINO TAKEO;TOMITA MASAHIRO;HIDAKA KISHIO
分类号 G01N23/225;G01N1/28;H01J37/20;(IPC1-7):H01J37/20 主分类号 G01N23/225
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