发明名称 |
Sample heating holder, method of observing a sample and charged particle beam apparatus |
摘要 |
High resolution observation of a sample at a high temperature above 1000 C. is accomplished by suppressing sample drift by heating over a short time and with small electric current. A heater envelope made of a ceramic having a carbon coating on the surface is attached around a heater surrounding the sample. The heater envelope is rotatable around pivot screws, and has an outer frame portion of a holder individually having slots capable of letting an FIB enter so that the sample mounting on the holder, as it is, may be milled with the FIB
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申请公布号 |
US6495838(B1) |
申请公布日期 |
2002.12.17 |
申请号 |
US19990354633 |
申请日期 |
1999.07.16 |
申请人 |
HITACHI, LTD.;HITACHI SCIENCE SYSTEMS, LTD. |
发明人 |
YAGUCHI TOSHIE;KAMINO TAKEO;TOMITA MASAHIRO;HIDAKA KISHIO |
分类号 |
G01N23/225;G01N1/28;H01J37/20;(IPC1-7):H01J37/20 |
主分类号 |
G01N23/225 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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