发明名称 Phase lock detection circuit for phase-locked loop circuit
摘要 The present invention relates to a phase-locked loop (PLL) circuit and, more particularly to a PLL with a phase lock detection circuit. The PLL circuit includes a phase detector, a charge pump, a loop filter, a voltage controlled oscillator (VCO), a frequency divider, and a phase lock detection circuit having two current charging/discharging circuits with first and second constant current sources for generating a phase lock signal having a pulse form through charging/discharging a capacitor. A voltage level of the capacitor is changed with a hysteresis characteristic. In the out-of-lock state of the PLL circuit, the discharging speed of the capacitor is faster than the charging speed thereof. In the phase lock state of the PLL circuit, the charging speed of the capacitor is faster than the discharging speed thereof. Since the charging/discharging operation of the capacitor is executed linearly and symmetrically, the phase lock detection circuit according to the present invention can obtain stable phase lock information. In addition, it is able to forecast the result of the phase lock state apart from a process variation by using the current mirror.
申请公布号 US6496554(B1) 申请公布日期 2002.12.17
申请号 US19990294466 申请日期 1999.04.20
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 AHN TAE-WON
分类号 H03L7/095;(IPC1-7):H03L7/095 主分类号 H03L7/095
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