发明名称 SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To actualize a deep expansion type diffusion area at low cost without increasing the number of processes as much as possible. SOLUTION: On the surface of an n-type epitaxial growth layer 12, a mask 13M for ion implantation is formed. The mask 13M for ion implantation is sued to perform the selective ion implantation of boron (<11> B<+> ) deep into the n-type epitaxial growth layer 12. Further, the mask 13M for ion implantation is used to carry out the selective ion implantation of aluminum (<27> Al<+> ) from the surface of the n-type epitaxial growth layer 12 shallower than the boron. Then p-type deep expansion diffusion areas 15a and 15b are formed by activating heat-treatment. The diffusion areas 15a and 15b increase in lateral diffusion width perpendicular to the depth toward an ohmic contact area 11.
申请公布号 JP2002359378(A) 申请公布日期 2002.12.13
申请号 JP20010302562 申请日期 2001.09.28
申请人 TOSHIBA CORP 发明人 IMAI SEIJI;SHINOHE TAKASHI
分类号 H01L29/872;H01L21/06;H01L21/265;H01L21/331;H01L21/336;H01L21/822;H01L27/06;H01L29/12;H01L29/161;H01L29/47;H01L29/737;H01L29/74;H01L29/78;H01L29/80 主分类号 H01L29/872
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