发明名称 |
SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To actualize a deep expansion type diffusion area at low cost without increasing the number of processes as much as possible. SOLUTION: On the surface of an n-type epitaxial growth layer 12, a mask 13M for ion implantation is formed. The mask 13M for ion implantation is sued to perform the selective ion implantation of boron (<11> B<+> ) deep into the n-type epitaxial growth layer 12. Further, the mask 13M for ion implantation is used to carry out the selective ion implantation of aluminum (<27> Al<+> ) from the surface of the n-type epitaxial growth layer 12 shallower than the boron. Then p-type deep expansion diffusion areas 15a and 15b are formed by activating heat-treatment. The diffusion areas 15a and 15b increase in lateral diffusion width perpendicular to the depth toward an ohmic contact area 11. |
申请公布号 |
JP2002359378(A) |
申请公布日期 |
2002.12.13 |
申请号 |
JP20010302562 |
申请日期 |
2001.09.28 |
申请人 |
TOSHIBA CORP |
发明人 |
IMAI SEIJI;SHINOHE TAKASHI |
分类号 |
H01L29/872;H01L21/06;H01L21/265;H01L21/331;H01L21/336;H01L21/822;H01L27/06;H01L29/12;H01L29/161;H01L29/47;H01L29/737;H01L29/74;H01L29/78;H01L29/80 |
主分类号 |
H01L29/872 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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