发明名称 |
ANALYZING ELEMENT AND METHOD FOR ANALYZING SAMPLE USING THE SAME |
摘要 |
<p>PROBLEM TO BE SOLVED: To facilitate a control of a structure of a diffraction grating and a control of properties of a surface which is contacted with a sample as an optical structure for inducing an evanescent wave in an analyzing element for analyzing a sample utilizing a surface plasmon resonance(SPR). SOLUTION: The analyzing element comprises the diffraction grating 5 formed by discretely laminating thin films 4 on a flat surface supported to a substrate 2, and a metal film formed by selecting any of a layer 3 for imparting the flat surface and the films 4.</p> |
申请公布号 |
JP2002357543(A) |
申请公布日期 |
2002.12.13 |
申请号 |
JP20010167166 |
申请日期 |
2001.06.01 |
申请人 |
MITSUBISHI CHEMICALS CORP |
发明人 |
ISOMURA SATORU;MUNEBAYASHI TAKAAKI;OOHIRAOCHI YOSHIHIRO |
分类号 |
G01N21/27;G01N21/41;G02B5/18;(IPC1-7):G01N21/27 |
主分类号 |
G01N21/27 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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