发明名称 ANALYZING ELEMENT AND METHOD FOR ANALYZING SAMPLE USING THE SAME
摘要 <p>PROBLEM TO BE SOLVED: To facilitate a control of a structure of a diffraction grating and a control of properties of a surface which is contacted with a sample as an optical structure for inducing an evanescent wave in an analyzing element for analyzing a sample utilizing a surface plasmon resonance(SPR). SOLUTION: The analyzing element comprises the diffraction grating 5 formed by discretely laminating thin films 4 on a flat surface supported to a substrate 2, and a metal film formed by selecting any of a layer 3 for imparting the flat surface and the films 4.</p>
申请公布号 JP2002357543(A) 申请公布日期 2002.12.13
申请号 JP20010167166 申请日期 2001.06.01
申请人 MITSUBISHI CHEMICALS CORP 发明人 ISOMURA SATORU;MUNEBAYASHI TAKAAKI;OOHIRAOCHI YOSHIHIRO
分类号 G01N21/27;G01N21/41;G02B5/18;(IPC1-7):G01N21/27 主分类号 G01N21/27
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