| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor having a self-refreshing function in which the inspection standard margin is improved by considering temperature fluctuation. SOLUTION: This device is provided with a resistance element R1 in which P channel MOS transistors P3 made non-conductive by an output of a super voltage discriminating circuit 2 at the time of a self-refreshing function inspection of upper stream inspection process are connected in parallel and one end is connected to a power source potential VCC, a resistance element R2 connected in series to the other end of this resistance element R1, and a N channel MOS transistor N5 which is connected in series between this resistance element R2 and a ground potential GND and of which a gate is commonly connected to a drain and a clock period control end of an oscillation means 32 being a reference clock generating means for self-refreshing of the next stage.
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