发明名称 METHOD, PROGRAM AND SYSTEM FOR ANALYSIS IN FINITE ELEMENT METHOD
摘要 PROBLEM TO BE SOLVED: To improve the analysis accuracy and shorten the analysis time by a finite element method(FEM) for a drop impact analysis of a highly-fine-meshed electronic appliance and the like. SOLUTION: A selection of an optimum method for analysis and an analysis means 102 comprise steps of: checking whether an analysis to be performed is an impact analysis or not (step A1), retrieving a minimum mesh size if determined to be an impact analysis (step A5), creating a model for a simple analysis with the minimum mesh size (step A6), performing preliminary analyses with a simple model by an implicit method and an explicit method for analysis (step A7), and selecting the optimum method either of the implicit method and explicit method in comparison among results of the preliminary analyses in step A7 or between the results and a result of an experiment or a regorous solution (step A8).
申请公布号 JP2002358335(A) 申请公布日期 2002.12.13
申请号 JP20010164730 申请日期 2001.05.31
申请人 NEC CORP 发明人 HIRATA ICHIRO
分类号 G06F17/50;(IPC1-7):G06F17/50 主分类号 G06F17/50
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