| 摘要 |
PROBLEM TO BE SOLVED: To provide a parallel mounted inspection board for semiconductor memory element and inspection method capable of improving the reliability of a mounting inspection process for inspecting a semiconductor element in an actually operating environment. SOLUTION: This parallel mounting inspection board 30 comprises one extension slot 35, one reference slot 34 and two or more parallel inspection slots 36 and 38 connected in parallel thereto. Memory modules to be inspected are mounted on the slots 34, 35, 36, and 38, respectively. When the reference slot 34 is operated, or the reading/writing operation to a memory module element mounted on the reference slot 34 is performed, the same reading/writing operation is performed for the parallel slots 36 and 38. The timing distorted by the extension slot 35 has influence on the reference slot 34, and also on the parallel inspection slots 36 and 38 operated similarly to the reference slot 34.
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