| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device capable of evaluating all settable characteristics of an internal circuit without causing a problem such as increase of chip size or difficulty of layout of the internal circuit. SOLUTION: An IC chip 1 comprises a characteristic setting circuit 12 for outputting a signal for setting the internal circuit 11 to a characteristic required in its actual use; a terminal T for inputting a signal outputted in order to set the characteristic of the internal circuit 11 from another IC chip 1 to be contact- connected to the IC chip 1 when testing, and a multiplexer 13 for selecting a signal outputted from the characteristic setting circuit 12 in the actual use and selecting a signal inputted through the terminal T when testing. The characteristic of the internal circuit 11 is set by the signal selected by the multiplexer 13.
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