发明名称 METHOD OF HEAT-TREATING SEMICONDUCTOR, AND APPARATUS USED FOR THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a superior method of heat-treating a semiconductor which overcomes the problems lying both in conventional hot-wall apparatus and lamp-heating apparatus, and to provide an apparatus used for the same. SOLUTION: This method is for heat-treatment of wafers 1, using a batch- type heat treatment apparatus. A cylindrical annular space 31 is formed around the periphery of a reaction tube 20, in which wafers 1 are loaded; the cylindrical annular space 31 is sealed with xenon gas on the inside, and a plurality of annular electrodes 32 are arranged in the cylindrical annular space 31, with specified mutual spacings in the axial direction of the cylindrical annular space 31; and heat treatment of the wafers 1 is performed by applying voltages to the annular electrodes 32, to make the xenon gas emit light in the cylindrical annular space 31.
申请公布号 JP2002359207(A) 申请公布日期 2002.12.13
申请号 JP20010163733 申请日期 2001.05.31
申请人 AIR WATER INC 发明人 YOSHINO AKIRA;MIYAMOTO ATSUSHI
分类号 H01L21/22;H01L21/205;H01L21/26;(IPC1-7):H01L21/26 主分类号 H01L21/22
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