| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device in which efficiency of a conduction test can be improved and by which a more detailed test can be performed. SOLUTION: In a test in which the same value is written in a plurality of memory cells and written data is read out again and it is tested whether the data is surely written and read out or not. At the time, as each read out data is simultaneously outputted from each corresponding output terminal, when all output terminals are not connected to a tester, efficiency is low. Then, a data compression circuit is provided in a SDRAM, if all data read out from each output terminal are the same value, an output signal is outputted from one output terminal previously determined, while when at least one data out of data read out from each output terminal is different from the other, it is not required that all output terminals are connected to the tester and an efficient test can be performed by making one output terminal previously determined have a high impedance.
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