发明名称 Device for comparing two resistances and a system incorporating the device for compensation of integrated resistances, especially for use in CMOS integrated circuits, with adjustment for resistance variations caused by temperature
摘要 Device for comparing two resistances (Rint, Rext) comprises a measurement circuit (MES) equipped with means (M0, M1) for extraction of currents (Iint, Iext) passing though the two resistances so that they can be fed to an analogue to digital converter (CAN) equipped with means for dividing the two currents and transforming the resulting ratio into a digital signal, actualized continuously as a function of the environmental parameters, especially the temperature. An Independent claim is made for a system for correcting the values of integrated compensation resistances using in electronic, especially CMOS, circuits.
申请公布号 FR2825802(A1) 申请公布日期 2002.12.13
申请号 FR20010007666 申请日期 2001.06.12
申请人 STMICROELECTRONICS SA 发明人 HASBANI FREDERIC
分类号 G01R17/10;G01R17/12;G01R27/14;(IPC1-7):G01R17/02;G01R27/02 主分类号 G01R17/10
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