发明名称 |
METHOD OF MAKING LOADLESS FOUR-TRANSISTOR MRMORY CELL WITH DIFFERENT GATE INSULATION THICKNESSES FOR N-CHANNEL DRIVE TRANSISTORS AND P-CHANNEL ACCESS TRANSISTORS |
摘要 |
A memory cell has a pair of n-ch drive MOS transistors, a pair of p-ch access MOS transistors. The access MOS transistor supply electric charge to storage nodes of the drive MOS transistors without using a resistive load. The gate insulation films of the drvie MOS transistors have a thickness lower than the thickness of the gate insulation films of the access MOS transistors for achieving stable and high-speed operation of the memory cell.
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申请公布号 |
US2002185663(A1) |
申请公布日期 |
2002.12.12 |
申请号 |
US20020212658 |
申请日期 |
2002.08.05 |
申请人 |
HASHIMOTO SHINGO |
发明人 |
HASHIMOTO SHINGO |
分类号 |
G11C11/41;G11C11/412;H01L21/8244;H01L27/11;(IPC1-7):G11C11/00 |
主分类号 |
G11C11/41 |
代理机构 |
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代理人 |
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地址 |
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