发明名称 METHOD OF MAKING LOADLESS FOUR-TRANSISTOR MRMORY CELL WITH DIFFERENT GATE INSULATION THICKNESSES FOR N-CHANNEL DRIVE TRANSISTORS AND P-CHANNEL ACCESS TRANSISTORS
摘要 A memory cell has a pair of n-ch drive MOS transistors, a pair of p-ch access MOS transistors. The access MOS transistor supply electric charge to storage nodes of the drive MOS transistors without using a resistive load. The gate insulation films of the drvie MOS transistors have a thickness lower than the thickness of the gate insulation films of the access MOS transistors for achieving stable and high-speed operation of the memory cell.
申请公布号 US2002185663(A1) 申请公布日期 2002.12.12
申请号 US20020212658 申请日期 2002.08.05
申请人 HASHIMOTO SHINGO 发明人 HASHIMOTO SHINGO
分类号 G11C11/41;G11C11/412;H01L21/8244;H01L27/11;(IPC1-7):G11C11/00 主分类号 G11C11/41
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