发明名称 Halbleiterstruktur mit ESD-Schutzeinrichtung
摘要 The invention relates to a semiconductor structure, comprising a substrate (102), a component layer (104) located on the substrate (102) and a contact (108). Said semiconductor structure has an ESD protection device (144a, 144), which is positioned between the substrate (102) and the contact (108) in such a way that if ESD occurs, the ESD protection device (144a, 144b) causes a cutout to the contact (108).
申请公布号 DE10126628(A1) 申请公布日期 2002.12.12
申请号 DE2001126628 申请日期 2001.05.31
申请人 INFINEON TECHNOLOGIES AG 发明人 HUBER, JAKOB;GNANNT, KLAUS;DIEFENBECK, KLAUS;KRUMBEIN, ULRICH
分类号 H01L23/60;H01L23/62;H01L27/02;H01L29/10;H01L29/73;H01L29/732;H01L29/735;(IPC1-7):H01L23/60 主分类号 H01L23/60
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