发明名称 |
Halbleiterstruktur mit ESD-Schutzeinrichtung |
摘要 |
The invention relates to a semiconductor structure, comprising a substrate (102), a component layer (104) located on the substrate (102) and a contact (108). Said semiconductor structure has an ESD protection device (144a, 144), which is positioned between the substrate (102) and the contact (108) in such a way that if ESD occurs, the ESD protection device (144a, 144b) causes a cutout to the contact (108). |
申请公布号 |
DE10126628(A1) |
申请公布日期 |
2002.12.12 |
申请号 |
DE2001126628 |
申请日期 |
2001.05.31 |
申请人 |
INFINEON TECHNOLOGIES AG |
发明人 |
HUBER, JAKOB;GNANNT, KLAUS;DIEFENBECK, KLAUS;KRUMBEIN, ULRICH |
分类号 |
H01L23/60;H01L23/62;H01L27/02;H01L29/10;H01L29/73;H01L29/732;H01L29/735;(IPC1-7):H01L23/60 |
主分类号 |
H01L23/60 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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