Test sequence generation method for testing of command controlled electronic circuits involves command sequence criterion with which an admissible command sequence can be differentiated from an inadmissible sequence

摘要

A command sequence criterion is given with which an admissible command sequence can be differentiated from an inadmissible sequence. The test method involves application of a repeating sequence of steps to test if the test command sequence list is admissible and whether it contains the required number of commands. The invention also relates to: (1) A corresponding computer program and computer program product for implementation of the method; and (2) Use of the method for testing of digital circuits, especially DRAMs, SRAMs or analogue circuits such as phase locked loops.