| 摘要 |
The invention is directed to providing a characteristic measuring method and characteristic measuring system of a WDM optical amplifier that enables high speed and accurate measurement of characteristics of an optical amplifier by a measuring system with a simple construction. To this end, with the characteristic measuring method of a WDM optical amplifier according to the invention, for example, a plurality of signal lights corresponding to respective signal light wavelengths in a measurement wavelength band are divided into groups for odd and even channel numbers, such that signal lights of adjacent wavelengths are in different groups, and the power of each signal light is adjusted such that the total power of the signal lights in each group is approximately equal to a preset reference value. Then, a WDM signal light containing the multiplexed signal lights is in turn input to the optical amplifier, and the spectrum of the output light spectrum the optical amplifier is input for each group. Based on the spectrum measurement results for each group, the output signal light power and the spontaneous emission light power of each signal light wavelength in the measurement wavelength band are judged.
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