发明名称 METHOD FOR REMOVING POLYSILANE FROM A SEMICONDUCTOR WITHOUT STRIPPING
摘要 A method for removing polysilane from a semiconductor substrate without stripping during manufacture of a semiconductor device, comprising:a) coating a polysilane on a semiconductor substrate and coating a resist on the polysilane;b) patterning the resist with exposure and development;c) transferring the pattern from the resist to the polysilane using an etch process selective to the resist;d) stripping the resist;e) transferring the pattern from the polysilane to a hardmask using an etch selective to the hardmask;f) subjecting the polysilane to thermal or plasma/thermal oxidation to convert the polysilane to silica; andetching the substrate and stripping off the hard mask.
申请公布号 WO02099864(A1) 申请公布日期 2002.12.12
申请号 WO2002US13448 申请日期 2002.04.29
申请人 INFINEON TECHNOLOGIES NORTH AMERICA CORP. 发明人 LU, ZHIJIAN;GENZ, OLIVER
分类号 H01L21/3065;H01L21/027;H01L21/033;H01L21/308;H01L21/311 主分类号 H01L21/3065
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