发明名称 |
METHOD FOR REMOVING POLYSILANE FROM A SEMICONDUCTOR WITHOUT STRIPPING |
摘要 |
A method for removing polysilane from a semiconductor substrate without stripping during manufacture of a semiconductor device, comprising:a) coating a polysilane on a semiconductor substrate and coating a resist on the polysilane;b) patterning the resist with exposure and development;c) transferring the pattern from the resist to the polysilane using an etch process selective to the resist;d) stripping the resist;e) transferring the pattern from the polysilane to a hardmask using an etch selective to the hardmask;f) subjecting the polysilane to thermal or plasma/thermal oxidation to convert the polysilane to silica; andetching the substrate and stripping off the hard mask. |
申请公布号 |
WO02099864(A1) |
申请公布日期 |
2002.12.12 |
申请号 |
WO2002US13448 |
申请日期 |
2002.04.29 |
申请人 |
INFINEON TECHNOLOGIES NORTH AMERICA CORP. |
发明人 |
LU, ZHIJIAN;GENZ, OLIVER |
分类号 |
H01L21/3065;H01L21/027;H01L21/033;H01L21/308;H01L21/311 |
主分类号 |
H01L21/3065 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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