发明名称 |
PHASE SHIFT SPECKLE INTERFEROMETER USING QUARTER WAVELENGTH PLATE AND POLARIZER |
摘要 |
PURPOSE: A phase shift speckle interferometer is provided to simplify system configuration and rapidly obtain degree of phase of a sample by using an inexpensive quarter wavelength plate and polarizer. CONSTITUTION: A phase shift speckle interferometer comprises a light wavelength expander(20) for expanding width of the light wavelength generated from a laser(10) serving as a light source; a light wavelength divider(30) for dividing the light wavelength output from the light wavelength expander into a first light wavelength and a second light wavelength; a first reflector plate(40a) and a second reflector plate(40b) for reflecting first and second light wavelengths divided by the light wavelength divider; a quarter wavelength plate(50) for changing polarizing direction of the incident first light wavelength; a polarizing plate(60) for selectively transmitting polarized light of the first light wavelength rotated by the quarter wavelength plate; a camera(80) for photographing interference caused between the first light wavelength passed through the polarizing plate and radiated to a sample(70) and the second light wavelength directly radiated to the sample; and a computer(90) for calculating degree of phase of interference in accordance with the images photographed by the camera.
|
申请公布号 |
KR20020092725(A) |
申请公布日期 |
2002.12.12 |
申请号 |
KR20010031516 |
申请日期 |
2001.06.05 |
申请人 |
KWON, HO SIK |
发明人 |
BAEK, TAE HYEON;KIM, MYEONG SU;KWON, HO SIK |
分类号 |
G01B9/02;(IPC1-7):G01B9/02 |
主分类号 |
G01B9/02 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|