发明名称 |
SEMICONDUCTOR TRANSISTOR USING L-SHAPED SPACER AND MANUFACTURING METHOD THEREOF |
摘要 |
PURPOSE: A semiconductor transistor and a method for manufacturing the same are provided to minimize an out-diffusion in an LDD(Lightly Doped Drain) region and to reduce a resistance of the LDD region by forming the LDD region after forming simultaneously a middle doped and heavily doped junction regions using an L-shaped spacer. CONSTITUTION: A gate pattern(300) is formed on a semiconductor substrate(100). A first insulating layer(130) is formed on the entire surface of the substrate(100) having the gate pattern(300). A third spacer(142) and a second spacer(151) are sequentially formed on the first insulating layer(130) of both sidewalls of the gate pattern, wherein the third and second spacers(142,151) have an L-shape including a horizontal protrusion. A heavily doped junction region(180) and a middle doped junction region are simultaneously formed in the substrate by implanting heavily doped ions using the gate pattern(300) and the second L-shaped spacer(151) as a mask. After annealing the resultant structure, the second L-shaped spacer(151) is removed. An LDD region is formed at lower of the horizontal protrusion of the third L-shaped spacer(142) by implanting lightly doped ions.
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申请公布号 |
KR20020092125(A) |
申请公布日期 |
2002.12.11 |
申请号 |
KR20010031030 |
申请日期 |
2001.06.02 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
BAE, GEUM JONG;CHOI, TAE HUI;KIM, SANG SU;KO, YEONG GEON;LEE, HWA SEONG;LEE, NAE IN |
分类号 |
H01L21/336;H01L29/78;(IPC1-7):H01L29/78 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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