发明名称 Bipolar transistor with raised extrinsic base fabricated in an integrated BiCMOS circuit
摘要 A process for forming a bipolar transistor with a raised extrinsic base, an emitter, and a collector integrated with a CMOS circuit with a gate. An intermediate semiconductor structure is provided having CMOS and bipolar areas. An intrinsic base layer is provided in the bipolar area. A base oxide is formed across, and a sacrificial emitter stack silicon layer is deposited on, both the CMOS and bipolar areas. A photoresist is applied to protect the bipolar area and the structure is etched to remove the sacrificial layer from the CMOS area only such that the top surface of the sacrificial layer on the bipolar area is substantially flush with the top surface of the CMOS area. Finally, a polish stop layer is deposited having a substantially flat top surface across both the CMOS and bipolar areas suitable for subsequent chemical-mechanical polishing (CMP) to form the raised extrinsic base.
申请公布号 US6492238(B1) 申请公布日期 2002.12.10
申请号 US20010887310 申请日期 2001.06.22
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 AHLGREN DAVID C.;FREEMAN GREGORY G.;HUANG FENG-YI;TICKNOR ADAM D.
分类号 H01L21/331;H01L21/8222;H01L21/8248;H01L21/8249;H01L27/06;H01L29/737;(IPC1-7):H01L21/00 主分类号 H01L21/331
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