发明名称 Dry etching device
摘要 It is an object of the present invention to provide an upper electrode which is prevented from being contaminated with an impurity, has a sufficient adhesive strength between the pedestal and electrode plate of silicon, secures high-precision parallelism with the lower electrode, and hence improves the etching characteristics and silicon wafer yield. It is another object of the present invention to provide a dry etching device equipped with the upper electrode. The present invention provides an upper electrode for dry etching devices, comprising an electrode plate of silicon which is supported by a pedestal, wherein (a) the pedestal is made of graphite, and (b) the electrode plate of silicon is joined to the pedestal by an organic adhesive containing a filler having a Young's modulus of 6x109 to 68x109N/m2.
申请公布号 US6491784(B2) 申请公布日期 2002.12.10
申请号 US20010900470 申请日期 2001.07.09
申请人 NISSHINBO INDUSTRIES, INC. 发明人 YAMAGUCHI AKIRA;NAKAYAMA FUMITSUGU
分类号 H01L21/302;H01J37/32;H01L21/3065;(IPC1-7):H05H1/00;C23C16/00;C23C14/00 主分类号 H01L21/302
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