发明名称 METHOD AND DEVICE FOR DETERMINING ELECTRIC CONDUCTING LAYER THICKNESS
摘要 FIELD: electrical engineering. SUBSTANCE: method involves measuring thickness (dr) of electric conducting layer coating electric conducting base material. Electric conductivities of the layer and base materials are different. Excitation coil through which high frequency electric current passes is brought close to the layer and it makes mechanical contact with it in particular cases so that electric eddy currents arises in the base material. Attached value corresponding to the total resistance is determined that is used as basis for determining layer thickness (dr) for instance by comparing with known reference values. High frequency electric current frequency f is selected in a way that single valued thickness (dr) measurement takes place when the electric current conductivities proportion is equal to 0.7-1.5. EFFECT: high accuracy and reliability of measurements. 11 cl, 3 dwg
申请公布号 RU2194243(C2) 申请公布日期 2002.12.10
申请号 RU19980113860 申请日期 1996.12.10
申请人 SIMENS AKTSIENGEZELL'SHAFT 发明人 BEKKER EHRIKH
分类号 G01B7/06;G01B7/00;G01R33/12 主分类号 G01B7/06
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