发明名称 Plasma apparatus and lower electrode thereof
摘要 The present invention is constituted of a lower electrode structure (1) comprising a base table (2) formed of a conductive material, an electrostatic adsorption member (3) formed on the base table (2) and having a dielectric layer (4) on which the substrate to be mounted and within which an electrode (5) electrically isolated from the base table (2) is housed, first wiring (7) having an end connected to the electrode (3) of the electrostatic adsorption member, a direct-current source (8) connected to the other end of the first wiring (7), second wiring (10) having an end connected to the base table (2), a high frequency source (11) connected to the other end of the second wiring (10), a third wiring (14) for connecting the first wiring (7) and the second wiring (10), and a capacitor (13) formed on the third wiring (14). Plasma processing is performed by disposing the lower electrode structure (1) in the chamber (21).
申请公布号 US6492612(B1) 申请公布日期 2002.12.10
申请号 US20010868645 申请日期 2001.06.28
申请人 TOKYO ELECTRON LIMITED 发明人 TAGUCHI CHIHIRO;NONAKA RYO
分类号 B23K10/00;H01L21/3065;H01L21/68;(IPC1-7):B23K10/00 主分类号 B23K10/00
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