发明名称 WAFER HANDLING METHOD, WAFER HANDLING APPARATUS, AND WAFER STAGE
摘要 PROBLEM TO BE SOLVED: To provide a wafer handling method, a wafer handling apparatus, and a wafer stage which are capable of reducing the number of processes and suppressing the yield deterioration due to handling. SOLUTION: The wafer handling apparatus 1 is equipped with a transferring means 40 for transferring a wafer W to a predetermined position when the wafer W is loaded. The wafer W after vapor phase epitaxial growth is taken out from a susceptor and is directly loaded on the wafer handling apparatus. Then, the loaded wafer is stored in a predetermined storing container 80 by the transferring means 40.
申请公布号 JP2002353285(A) 申请公布日期 2002.12.06
申请号 JP20010160903 申请日期 2001.05.29
申请人 SHIN ETSU HANDOTAI CO LTD 发明人 KITAMURA IKUO
分类号 H01L21/677;H01L21/68;(IPC1-7):H01L21/68 主分类号 H01L21/677
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