发明名称 |
WAFER HANDLING METHOD, WAFER HANDLING APPARATUS, AND WAFER STAGE |
摘要 |
PROBLEM TO BE SOLVED: To provide a wafer handling method, a wafer handling apparatus, and a wafer stage which are capable of reducing the number of processes and suppressing the yield deterioration due to handling. SOLUTION: The wafer handling apparatus 1 is equipped with a transferring means 40 for transferring a wafer W to a predetermined position when the wafer W is loaded. The wafer W after vapor phase epitaxial growth is taken out from a susceptor and is directly loaded on the wafer handling apparatus. Then, the loaded wafer is stored in a predetermined storing container 80 by the transferring means 40. |
申请公布号 |
JP2002353285(A) |
申请公布日期 |
2002.12.06 |
申请号 |
JP20010160903 |
申请日期 |
2001.05.29 |
申请人 |
SHIN ETSU HANDOTAI CO LTD |
发明人 |
KITAMURA IKUO |
分类号 |
H01L21/677;H01L21/68;(IPC1-7):H01L21/68 |
主分类号 |
H01L21/677 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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