发明名称 METHOD FOR FORMING THIN FILM AND METHOD FOR FABRICATING THIN FILM TRANSISTOR
摘要 PROBLEM TO BE SOLVED: To provide a thin film transistor having enhanced characteristics. SOLUTION: When an amorphous silicon thin film is irradiated with a laser beam and crystallized, the substrate is warped upward in order to reduce residual stress in the silicon film which is then used as a semiconductor layer thus fabricating a thin film transistor having enhanced characteristics.
申请公布号 JP2002353139(A) 申请公布日期 2002.12.06
申请号 JP20010160300 申请日期 2001.05.29
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 SANO HIROSHI;KAWAMURA TETSUYA
分类号 H01L21/20;H01L21/336;H01L29/786;(IPC1-7):H01L21/20 主分类号 H01L21/20
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