发明名称 |
METHOD FOR FORMING THIN FILM AND METHOD FOR FABRICATING THIN FILM TRANSISTOR |
摘要 |
PROBLEM TO BE SOLVED: To provide a thin film transistor having enhanced characteristics. SOLUTION: When an amorphous silicon thin film is irradiated with a laser beam and crystallized, the substrate is warped upward in order to reduce residual stress in the silicon film which is then used as a semiconductor layer thus fabricating a thin film transistor having enhanced characteristics.
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申请公布号 |
JP2002353139(A) |
申请公布日期 |
2002.12.06 |
申请号 |
JP20010160300 |
申请日期 |
2001.05.29 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
SANO HIROSHI;KAWAMURA TETSUYA |
分类号 |
H01L21/20;H01L21/336;H01L29/786;(IPC1-7):H01L21/20 |
主分类号 |
H01L21/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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