发明名称 METHOD AND EQUIPMENT FOR FABRICATING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method and equipment for fabricating semiconductor device, by which a high dielectric film such as BST film or ST film that is excellent in film forming properties, such as electrical properties is made. SOLUTION: The equipment has a boat 23 holding a plurality of wafers 22 lined up in a reaction chamber 10 at a fixed intervals in a direction perpendicular to the wafer surfaces, an oxidation gas introduction nozzle 32 located almost parallel to the array direction of the wafers 22 to form a layered oxidation gas flow in the vicinity of each surface of the wafers 22 and a dispersion nozzle 30 located almost parallel to the direction of the array of the wafers 22 to form a layered source gas flow in the vicinity of each surface of the wafers 22.
申请公布号 JP2002353208(A) 申请公布日期 2002.12.06
申请号 JP20010159415 申请日期 2001.05.28
申请人 FUJITSU LTD;TOSHIBA CORP 发明人 NAKAHIRA JUNYA;KIYOTOSHI MASAHIRO
分类号 C23C16/40;H01L21/31;(IPC1-7):H01L21/31 主分类号 C23C16/40
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