发明名称 |
METHOD FOR MENDING PATTERN ERROR OF SEMICONDUCTOR LAYER IN TFT LCD PANEL |
摘要 |
PURPOSE: A method for mending a pattern error of a semiconductor layer in a TFT LCD panel is provided to remove a bad semiconductor layer without a damage of a base layer by using a plasma etch method instead of a laser etch method. CONSTITUTION: A metal is deposited on a glass substrate. A photoresist is applied on the metal of the glass substrate. A photoresist pattern is formed by exposing and developing the photoresist. A gate electrode(2) is formed by etching the exposed metal. A gate insulating layer and a semiconductor layer(4) are formed on a whole surface of the above structure. A photoresist is applied on the whole surface of the semiconductor layer(4). A photoresist pattern is formed by performing an exposure process and a developing process. An active region is formed by etching the semiconductor layer(4). A bad semiconductor layer pattern is removed by performing a plasma etch process. A metal is deposited thereon. A source(5) and a drain(6) are formed by patterning the metal. A data line(7) is formed by the metal patterning process. A passivation layer is deposited thereon. The drain(6) is exposed by forming a contact hole. An ITO layer is deposited thereon. A pixel electrode(9) is formed by performing a photo etch process.
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申请公布号 |
KR20020091630(A) |
申请公布日期 |
2002.12.06 |
申请号 |
KR20010030458 |
申请日期 |
2001.05.31 |
申请人 |
LG.PHILIPS LCD CO., LTD. |
发明人 |
MUN, GYO HO |
分类号 |
H01L29/786;(IPC1-7):H01L29/786 |
主分类号 |
H01L29/786 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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