发明名称 |
WAFER EDGE EXPOSURE SYSTEM |
摘要 |
PURPOSE: A wafer edge exposure system is provided to maximize the integrated amount of exposure in an exposure process by improving a structure of an exposure system. CONSTITUTION: A mask is formed with a glass plate. Only an aperture part of the glass mask is formed with a transparent portion in order to transmit the light. Chrome is coated on the remaining portion except for the aperture portion of the glass plate. An aperture is formed on a mask. The aperture has a contact portion of a concave curve. In the aperture having the contact portion of the concave curve, a phase(m) of a light source is contacted with two points of a boundary(s) between an exposure region of a wafer and an unexposed region of the wafer. Accordingly, a photoresist slope of an edge part of the wafer is improved in comparison with an existing mask.
|
申请公布号 |
KR20020091437(A) |
申请公布日期 |
2002.12.06 |
申请号 |
KR20010030113 |
申请日期 |
2001.05.30 |
申请人 |
DNS KOREA CO., LTD. |
发明人 |
HAM, JUN HO;OH, CHANG SEOK |
分类号 |
H01L21/027;(IPC1-7):H01L21/027 |
主分类号 |
H01L21/027 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|