发明名称 Method of manufacturing alignment mark
摘要 A method for manufacturing a highly reliable alignment mark in which by-products do not form at an aligning mark position during patterning. In this method, an intermediate layer is disposed on an upper layer of a first wiring to protect the first wiring. Then, a filling material is coated thereon to fill in a through hole. Thereafter, a plug is formed by etch-backing, and a second wiring is formed.
申请公布号 US2002178600(A1) 申请公布日期 2002.12.05
申请号 US20020034108 申请日期 2002.01.03
申请人 MACHIDA SATOSHI;MINAMI AKIYUKI 发明人 MACHIDA SATOSHI;MINAMI AKIYUKI
分类号 G03F9/00;H01L21/027;H01L23/544;(IPC1-7):G01D21/00 主分类号 G03F9/00
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