发明名称 Method for manufacturing transistor
摘要 A method of manufacturing a transistor. The method comprising the steps of providing a substrate. The substrate comprises a gate oxide layer formed thereon, a polysilicon layer formed on the gate oxide layer, an offset spacer formed on a sidewall of the polysilicon layer and the gate oxide layer and a source/drain formed in the substrate. A conformal dielectric layer is formed over the polysilicon layer, the offset spacer and the source/drain. A spacer is formed on the sidewall of a portion of the conformal dielectric layer over the offset spacer. A portion of the conformal dielectric layer is removed to expose the polysilicon layer and the source/drain. A selective epitaxial growth process is performed to form an epitaxial layer on the polysilicon layer and the source/drain. A portion of the epitaxial layer on the polysilicon layer, the polysilicon layer and the gate oxide layer together form a T-type gate structure.
申请公布号 US2002182799(A1) 申请公布日期 2002.12.05
申请号 US20010880519 申请日期 2001.06.12
申请人 HUANG KUO-TAI;CHENG ELLEN 发明人 HUANG KUO-TAI;CHENG ELLEN
分类号 H01L21/28;H01L21/336;H01L29/423;H01L29/78;(IPC1-7):H01L21/823 主分类号 H01L21/28
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