IC ANALYSIS SUPPORT METHOD,IC ANALYSIS APPARATUS,IC ANALYSIS SUPPORT PROGRAM

摘要

An IC analysis support method in which a wiring path is extracted only from CAD layout data which is design information on an IC as a device to be tested and the extracted wiring path is highlighted when displayed, facilitating to navigate (survey) a defect, and an IC analysis apparatus using the method. The IC analysis support method in which layout data of CAD data is received by a computer and a wiring path is displayed comprises a step for judging whether a viahole exists in the overlapping portion between a first polygon and a second polygon constituting the wiring path and a step for recognizing the first polygon and the second polygon as one wiring path if a viahole is found.