发明名称 Apparatus for and method of processing an object to be processed
摘要 A magnetron reactive ion etching apparatus comprises: an electrode unit including electrodes facing each other through a semiconductor device; a high-frequency power source forming an electric field on the electrode unit; a dipole ring magnet; and a switching mechanism. The dipole ring magnet forms the first magnetic field state, including a magnetic field in a direction perpendicular to a direction of the electric field or in a direction parallel to the semiconductor device, and the second magnetic field state, including a magnetic field whose strength at the periphery of the surface of the semiconductor device is so satisfactory that an electron Larmor radius is larger than the mean free path of electrons. The first magnetic field state is switched to the second magnetic field state at a predetermined timing by the switching mechanism which is controlled by a controller.
申请公布号 US2002179249(A1) 申请公布日期 2002.12.05
申请号 US20020197859 申请日期 2002.07.19
申请人 TOKYO ELECTRON LIMITED 发明人 MORIMOTO TAMOTSU
分类号 H01L21/302;H01J37/32;H01J37/34;H01L21/00;H01L21/203;H01L21/205;H01L21/3065;H05H1/00;(IPC1-7):C23F1/00;C23C16/00 主分类号 H01L21/302
代理机构 代理人
主权项
地址